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Publication by Jean-Luc Deschanvres

Published on January 26, 2017
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Communique December 22, 2016

The paper "SIRIUS: A new beamline for in situ X-ray diffraction and spectroscopy studies of advanced materials and nanostructures at the SOLEIL Synchrotron" has been published in Thin Solid Films

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Here you will find the paper by Jean-Luc Deschanvres

"We present a new beamline of Synchrotron SOLEIL dedicated to the study of thin films, nanostructures, and advancedmaterials via X-ray diffraction and spectroscopy in the energy range 1.4–12 keV. This range coversmost of the absorption edges of interest in the fields of semiconductors and functional oxides. In order to meet the increasing demand of advanced real-time characterization of nanoscale materials, the beamline  optics and instrumentation have been designed with remarkable dynamic characteristics. SIRIUS presently ends in two experimental stations used for in situ X-ray characterization: a baby chamber and a chemical reactor, both mounted on a large seven-circle diffractometer. The rector is dedicated to atomic layer deposition and metal  organic chemical vapor deposition of oxide materials. The third end-station, an in-vacuum diffractometer, will be operative by the end of 2016. SIRIUS offers several synchrotron radiation techniqueswhich can be performed simultaneously or quasi-simultaneously on the same sample. We show here some examples of the first in situ results obtained at the beamline."


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Date of update January 26, 2017

Univ. Grenoble Alpes