office 1-05 Postal address: Grenoble-INP Minatec 3, parvis Louis Néel BP257 F-38016 GRENOBLE cedex 1
Site internet : http://
Born on 25th February 1975 in Kozani (Greece)
Structural Characterization: Use of Transmission Electron Microscopy (TEM) in high resolution, energy filtered, conventional and convergent beam modes to characterize nitride nanostructures (quantum wells and dots). Quantitative analysis of HRTEM images using the geometric phase analysis, a projection method and images simulations.
Epitaxy : Experience in Molecular Beam Epitaxy of III-nitride materials and heterostructures. In situ analytics of growth kinetics by RHEED.
X ray Absorption spectroscopy (Synchrotron, ESRF): Use of x-ray linear dichroism (XLD) and x-ray magnetic circular dichroism (XMCD) techniques. Selected publications
Structural Characterization: Use of TEM techniques to characterize the microstructure of superconducting layers (YBCO) and oxide buffer layers (LZO, CeO2) deposited on LaAlO3 and NiW substrates.
Chemical Deposition: Experience on Metal Organic Deposition (MOD) and various annealing treatments used for the growth of oxide buffer layers.
Keywords: TEM, Nitrides, MBE, X-ray absorption, MOD, Nanostructures, Supraconductors, Thermal treatment.
mise à jour le 20 mars 2019